Test Pin of IEC 60601-1 Figure 8

Test Pin of IEC 60601-1 Figure 8

This test probe Pin is intended to verify the protection against access to hazardous live parts in class 0 equipment and class II equipment (see IEC60536).

Conforms to:

Standard IEC 60601-1, IEC 61032, IEC 60065, IEC 60335-1, IEC 60950, IEC 60745 and UL etc.

Technical Parameter:

Test probe diameter:3 mm

Test probe length:15 mm

Baffle plate thickness:4 mm

Baffle plate diameter:25 mm

Handle length:20 mm

Handle diameter:10 mm

HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.

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